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The image on the left shows an atomic force microscope measurement of the normal and lateral forces between a nanosized untreated silicon tip and three different flat solid surfaces in deionized water. Also shown is a scanning electron microscopy image o
The image on the left shows an atomic force microscope measurement of the normal and lateral forces between a nanosized untreated silicon tip and three different flat solid surfaces in deionized water. Also shown is a scanning electron microscopy image of the tip apex. The graphic on the right depicts an atomic configuration illustrating the molecular-dynamics simulation model.
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